Computer system for analysis of X-ray images of wheat grains (a preliminary announcement)
 
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1
Institute of Electronics, Technical University of Łódź, Stefanowskiego18/22, 90-924 Łódź, Poland
2
Institute of Agrophysics, Polish Academy of Science, Doświadczalna 4, P.O. Box. 201, 20-290 Lublin 27, Poland
Acceptance date: 1998-04-01
 
Int. Agrophys. 1999, 13(1): 133–140
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ABSTRACT
Main elements of a computer system for analysis of X-ray images of wheat grains are outlined in the paper. In particular a specially developed software package (named GRAINS) for visualisation of grain images and for aiding kernel quality assessment analyses is presented. The package works in Windows 95 programming environment and has a menu driven user interface so enabling quick and easy access to all program functions. The program workplace enables simultaneous display of va- rious objects processed in the package, i.e., images, graphics, text documents, and spreadsheets. Main program capabilities include: loading and displaying X-ray grain images, measurements of main geometrical features and statistical parameters of grain images, quantitative assessment of the quality of grain kernels by calculating positional damage indices, and generation of binary and text report files.
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